Applied RHEED
Produktinformationen "Applied RHEED"
The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
| Autor: | Braun, Wolfgang |
|---|---|
| ISBN: | 9783662156148 |
| Verlag: | Springer Berlin |
| Auflage: | 1 |
| Sprache: | Englisch |
| Seitenzahl: | 220 |
| Produktart: | Kartoniert / Broschiert |
| Erscheinungsdatum: | 20.11.2013 |
| Verlag: | Springer Berlin |
| Untertitel: | Reflection High-Energy Electron Diffraction During Crystal Growth |
| Schlagworte: | electron energy loss spectroscopy epitaxy semiconductor simulation spectroscopy |