On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits
Produktinformationen "On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits"
Presents a unique approach for detection of radiation-induced transient faults in integrated circuitsDescribes the effects of ionizing particles in the transistor body and discusses its exploitationIncludes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications
| Autor: | Bastos, Rodrigo Possamai Torres, Frank Sill |
|---|---|
| ISBN: | 9783030293529 |
| Verlag: | Springer International Publishing Springer International Publishing AG |
| Auflage: | 001 |
| Sprache: | Englisch |
| Seitenzahl: | 196 |
| Produktart: | Gebunden |
| Erscheinungsdatum: | 11.10.2019 |
| Verlag: | Springer International Publishing Springer International Publishing AG |
| Schlagworte: | Elektronik Rechnerarchitektur und Logik-Entwurf SoftErrors; fault-tolerantsystems; Dependableembeddedprocessors; Radiation-InducedTransientFaults; BodyBuilt-inSensors |
Verwandte Artikel
On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits
ISBN: 9783030293550
60,98 €*