Process Variations and Probabilistic Integrated Circuit Design

Produktinformationen "Process Variations and Probabilistic Integrated Circuit Design"
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
ISBN: 9781441966209
Verlag: Springer US
Auflage: 1
Sprache: Englisch
Seitenzahl: 252
Produktart: Gebunden
Herausgeber: Dietrich, Manfred Haase, Joachim
Erscheinungsdatum: 19.11.2011
Verlag: Springer US
Schlagworte: Circuit Design DFM Design for Manufacturing Embedded Systems Probabilistic integrated circuit design Process Variation

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